Supporting Information
| Supporting Information File 1: The effect of varying the Lens 2 voltage on the BN deflection pattern. | ||
| Format: MP4 | Size: 28.2 MB | Download |
| Supporting Information File 2: The effect of varying the Lens 2 voltage on the MgO deflection pattern. | ||
| Format: MP4 | Size: 45.6 MB | Download |
| Supporting Information File 3: Description of supporting videos 1 and 2, SIMION results and methods (defocus and size on sample plane), a defocus series for a polycrystalline silicon sample, a magnification of images showing distortion of grid squares and a photograph of the THIM instrument. | ||
| Format: PDF | Size: 1.0 MB | Download |
Cite the Following Article
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
Michael Mousley, Santhana Eswara, Olivier De Castro, Olivier Bouton, Nico Klingner, Christoph T. Koch, Gregor Hlawacek and Tom Wirtz
Beilstein J. Nanotechnol. 2019, 10, 1648–1657.
https://doi.org/10.3762/bjnano.10.160
How to Cite
Mousley, M.; Eswara, S.; De Castro, O.; Bouton, O.; Klingner, N.; Koch, C. T.; Hlawacek, G.; Wirtz, T. Beilstein J. Nanotechnol. 2019, 10, 1648–1657. doi:10.3762/bjnano.10.160
Download Citation
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window
below.
Citation data in RIS format can be imported by all major citation management software, including EndNote,
ProCite, RefWorks, and Zotero.
Presentation Graphic
| Picture with graphical abstract, title and authors for social media postings and presentations. | ||
| Format: PNG | Size: 757.3 KB | Download |
Citations to This Article
Up to 20 of the most recent references are displayed here.
Scholarly Works
- Mousley, M.; Tabean, S.; Bouton, O.; Hoang, Q. H.; Wirtz, T.; Eswara, S. Scanning Transmission Ion Microscopy Time-of-Flight Spectroscopy Using 20 keV Helium Ions. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2023, 29, 563–573. doi:10.1093/micmic/ozac049
- Holeňák, R.; Lohmann, S.; Primetzhofer, D. Sensitive multi-element profiling with high depth resolution enabled by time-of-flight recoil detection in transmission using pulsed keV ion beams. Vacuum 2022, 204, 111343. doi:10.1016/j.vacuum.2022.111343
- Eswara, S.; Tabean, S.; Mousley, M.; Hoang, Q. H.; Bouton, O.; De Castro, O.; Serralta, E.; Klingner, N.; Hlawacek, G.; Wirtz, T. Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions. Microscopy and Microanalysis 2022, 28, 34–35. doi:10.1017/s1431927622001052
- Tabean, S.; Mousley, M.; Pauly, C.; De Castro, O.; Serralta, E.; Klingner, N.; Mücklich, F.; Hlawacek, G.; Wirtz, T.; Eswara, S. Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects. Ultramicroscopy 2021, 233, 113439. doi:10.1016/j.ultramic.2021.113439
- Audinot, J.-N.; Philipp, P.; De Castro, O.; Biesemeier, A.; Hoang, Q. H.; Wirtz, T. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope. Reports on progress in physics. Physical Society (Great Britain) 2021, 84, 105901. doi:10.1088/1361-6633/ac1e32
- Mousley, M.; Moeller, W.; Philipp, P.; Bouton, O.; Klingner, N.; Serralta, E.; Hlawacek, G.; Wirtz, T.; Eswara, S. Transmission ion microscopy and time-of-flight spectroscopy. Microscopy and Microanalysis 2021, 27, 1930–1932. doi:10.1017/s1431927621007017
- Schmidt, M.; Byrne, J. M.; Maasilta, I. Bio-imaging with the helium-ion microscope : a review. Beilstein journal of nanotechnology 2021, 12, 1–23. doi:10.3762/bjnano.12.1
- Mousley, M.; Möller, W.; Philipp, P.; Hlawacek, G.; Wirtz, T.; Eswara, S. Structural and chemical evolution of Au-silica core-shell nanoparticles during 20 keV helium ion irradiation: a comparison between experiment and simulation. Scientific reports 2020, 10, 12058. doi:10.1038/s41598-020-68955-7
- Holeňák, R.; Lohmann, S.; Primetzhofer, D. Contrast modes in a 3D ion transmission approach at keV energies. Ultramicroscopy 2020, 217, 113051. doi:10.1016/j.ultramic.2020.113051
- Ahmad, I.; Jan, R.; Khan, H. U.; Hussain, A.; Khan, S. A. Imaging, deposition, and self-assembly of CTAB stabilized gold nanostructures. SN Applied Sciences 2020, 2, 1–11. doi:10.1007/s42452-020-2888-8
- Holeňák, R.; Lohmann, S.; Primetzhofer, D. Contrast modes in a 3D ion transmission approach at keV energies. 2020.
