Beilstein J. Nanotechnol. 2019, 10, 746–759. https://doi.org/10.3762/bjnano.10.74
Supporting Information File 1: Details on the EP measurements, GIXD data recorded after annealing at 600 °C, saturation curves for the PE-ALD ZnO process optimized at room temperature, example of fitting of the HR XPS peak associated to O 1s. | ||
Format: PDF | Size: 493.6 KB | Download |
Article Citation | |
Download RIS (Reference Manager) | Download BIB (BIBTEX) |
Cited References | |
Download RIS (Reference Manager) | Download BIB (BIBTEX) |
Picture with graphical abstract, title and authors for social media postings and presentations.
Format: PNG | Size: 823.6 KB | Download |