Beilstein J. Nanotechnol. 2020, 11, 1764–1775. doi:10.3762/bjnano.11.159
This supporting information file presents ∂C/∂V phase and sMIM-C results and analyses obtained for a staircase silicon sample.
Supporting Information File 1: Additional results of scanning microwave impedance microscopy and dynamic spectroscopy-based mapping of integrated PIN diodes. | ||
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