Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

Edgar Cruz Valeriano, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon and José Martín Yañez Limón
Beilstein J. Nanotechnol. 2020, 11, 703–716. https://doi.org/10.3762/bjnano.11.58

Cite the Following Article

Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach
Edgar Cruz Valeriano, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon and José Martín Yañez Limón
Beilstein J. Nanotechnol. 2020, 11, 703–716. https://doi.org/10.3762/bjnano.11.58

How to Cite

Cruz Valeriano, E.; Gervacio Arciniega, J. J.; Enriquez Flores, C. I.; Meraz Dávila, S.; Moreno Palmerin, J.; Hernández Landaverde, M. A.; Chipatecua Godoy, Y. L.; Gutiérrez Peralta, A. M.; Ramírez Bon, R.; Yañez Limón, J. M. Beilstein J. Nanotechnol. 2020, 11, 703–716. doi:10.3762/bjnano.11.58

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