Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

Nicholas Chan, Carrie Lin, Tevis Jacobs, Robert W. Carpick and Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739. https://doi.org/10.3762/bjnano.11.60

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Nicholas Chan, Carrie Lin, Tevis Jacobs, Robert W. Carpick and Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739. https://doi.org/10.3762/bjnano.11.60

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Chan, N.; Lin, C.; Jacobs, T.; Carpick, R. W.; Egberts, P. Beilstein J. Nanotechnol. 2020, 11, 729–739. doi:10.3762/bjnano.11.60

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TY  - JOUR
A1  - Chan, Nicholas
A1  - Lin, Carrie
A1  - Jacobs, Tevis
A1  - Carpick, Robert W.
A1  - Egberts, Philip
T1  - Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy
JF  - Beilstein Journal of Nanotechnology
PY  - 2020///
VL  - 11
SP  - 729
EP  - 739
SN  - 2190-4286
DO  - 10.3762/bjnano.11.60
PB  - Beilstein-Institut
JA  - Beilstein J. Nanotechnol.
UR  - https://doi.org/10.3762/bjnano.11.60
KW  - adhesion
KW  - atomic force microscopy
KW  - diamond
KW  - frequency-modulated AFM
KW  - interaction potential
KW  - Lennard-Jones
KW  - surfaces
N2  - The interaction potential between two surfaces determines the adhesive and repulsive forces between them. It also determines interfacial properties, such as adhesion and friction, and is a key input into mechanics models and atomistic simulations of contacts. We have developed a novel methodology to experimentally determine interaction potential parameters, given a particular potential form, using frequency-modulated atomic force microscopy (AFM). Furthermore, this technique can be extended to the experimental verification of potential forms for any given material pair. Specifically, interaction forces are determined between an AFM tip apex and a nominally flat substrate using dynamic force spectroscopy measurements in an ultrahigh vacuum (UHV) environment. The tip geometry, which is initially unknown and potentially irregularly shaped, is determined using transmission electron microscopy (TEM) imaging. It is then used to generate theoretical interaction force–displacement relations, which are then compared to experimental results. The method is demonstrated here using a silicon AFM probe with its native oxide and a diamond sample. Assuming the 6-12 Lennard-Jones potential form, best-fit values for the work of adhesion (Wadh) and range of adhesion (z0) parameters were determined to be 80 ± 20 mJ/m2 and 0.6 ± 0.2 nm, respectively. Furthermore, the shape of the experimentally extracted force curves was shown to deviate from that calculated using the 6-12 Lennard-Jones potential, having weaker attraction at larger tip–sample separation distances and weaker repulsion at smaller tip–sample separation distances. This methodology represents the first experimental technique in which material interaction potential parameters were verified over a range of tip–sample separation distances for a tip apex of arbitrary geometry.
ER  -

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