Cite the Following Article
Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy
Nicholas Chan, Carrie Lin, Tevis Jacobs, Robert W. Carpick and Philip Egberts
Beilstein J. Nanotechnol. 2020, 11, 729–739.
https://doi.org/10.3762/bjnano.11.60
How to Cite
Chan, N.; Lin, C.; Jacobs, T.; Carpick, R. W.; Egberts, P. Beilstein J. Nanotechnol. 2020, 11, 729–739. doi:10.3762/bjnano.11.60
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