Supporting Information
| Supporting Information File 1: Evaluation of the third sideband of the measurement shown in Figure 3. | ||
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Cite the Following Article
Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy
Christian Ritz, Tino Wagner and Andreas Stemmer
Beilstein J. Nanotechnol. 2020, 11, 911–921.
https://doi.org/10.3762/bjnano.11.76
How to Cite
Ritz, C.; Wagner, T.; Stemmer, A. Beilstein J. Nanotechnol. 2020, 11, 911–921. doi:10.3762/bjnano.11.76
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- Arrighi, A.; Ullberg, N.; Derycke, V.; Grévin, B. A simple KPFM-based approach for electrostatic- free topographic measurements: the case of MoS2on SiO2. Nanotechnology 2023, 34, 215705. doi:10.1088/1361-6528/acbe02
- Nörenberg, T.; Wehmeier, L.; Lang, D.; Kehr, S. C.; Eng, L. M. Compensating for artifacts in scanning near-field optical microscopy due to electrostatics. APL Photonics 2021, 6, 036102. doi:10.1063/5.0031395
