Beilstein J. Nanotechnol. 2020, 11, 1019–1025. doi:10.3762/bjnano.11.86
Supporting Information File 1: Characterization details of g-C3N4 by XRD and XPS. Electron microscope analysis of Ni, Cu, ZnF2, NiF2, and ZnO nanostructures. | ||
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Giridhar U. Kulkarni and C.N.R. Rao