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Cite the Following Article
Determining amplitude and tilt of a lateral force microscopy sensor
Oliver Gretz, Alfred J. Weymouth, Thomas Holzmann, Korbinian Pürckhauer and Franz J. Giessibl
Beilstein J. Nanotechnol. 2021, 12, 517–524.
https://doi.org/10.3762/bjnano.12.42
How to Cite
Gretz, O.; Weymouth, A. J.; Holzmann, T.; Pürckhauer, K.; Giessibl, F. J. Beilstein J. Nanotechnol. 2021, 12, 517–524. doi:10.3762/bjnano.12.42
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Scholarly Works
- Nam, S.; Riegel, E.; Hörmann, L.; Hofmann, O. T.; Gretz, O.; Weymouth, A. J.; Giessibl, F. J. Exploring in-plane interactions beside an adsorbed molecule with lateral force microscopy. Proceedings of the National Academy of Sciences of the United States of America 2024, 121, e2311059120. doi:10.1073/pnas.2311059120
- Rahe, P.; Heile, D.; Olbrich, R.; Reichling, M. Quantitative dynamic force microscopy with inclined tip oscillation. Beilstein journal of nanotechnology 2022, 13, 610–619. doi:10.3762/bjnano.13.53
- Weymouth, A. J.; Gretz, O.; Riegel, E.; Giessibl, F. J. Measuring sliding friction at the atomic scale. Japanese Journal of Applied Physics 2022, 61, SL0801. doi:10.35848/1347-4065/ac5e4a
