A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques

Berkin Uluutku, Enrique A. López-Guerra and Santiago D. Solares
Beilstein J. Nanotechnol. 2021, 12, 1063–1077. https://doi.org/10.3762/bjnano.12.79

Supporting Information

The Supporting Information features derivations of generalized Voigt and Maxwell–Wiechert models in the Laplace and the z-domains; a brief overview of Fourier, modified Fourier, Laplace, and Z-transforms; additional data illustrating the misrepresentation of the system in the Fourier domain and additional data from AFM simulations; and, finally, a detailed analysis of loss and storage as a function of frequency and their estimation from modified Fourier transforms.

Supporting Information File 1: Additional methodical data.
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Cite the Following Article

A new method for obtaining model-free viscoelastic material properties from atomic force microscopy experiments using discrete integral transform techniques
Berkin Uluutku, Enrique A. López-Guerra and Santiago D. Solares
Beilstein J. Nanotechnol. 2021, 12, 1063–1077. https://doi.org/10.3762/bjnano.12.79

How to Cite

Uluutku, B.; López-Guerra, E. A.; Solares, S. D. Beilstein J. Nanotechnol. 2021, 12, 1063–1077. doi:10.3762/bjnano.12.79

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