Supporting Information
Additional AFM measurements identifying the tip–sample detachment signature are provided in Supporting Information File 1. These were performed using the same Cypher S AFM microscope with an ACLA AFM cantilever (Applied NanoStructures, Inc., Mountain View, CA, USA) on a silicon sample, but driven by a piezoelectric actuator under the sample instead of via photothermal excitation. This leads to less ideal (“forest of peaks”) transfer functions and can complicate parameter identification [41,42].
A second simulation-only example with hypothetical parameter values is provided in Supporting Information File 2. The associated NNMs are collected into a FPO like those of Figure 3.
| Supporting Information File 1: Additional AFM measurements. | ||
| Format: PDF | Size: 693.9 KB | Download |
| Supporting Information File 2: Hypothetical simulations with NNMs. | ||
| Format: PDF | Size: 873.6 KB | Download |
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Scholarly Works
- Deolia, A.; Raman, A.; Wagner, R. Low frequency photothermal excitation of AFM microcantilevers. Journal of Applied Physics 2023, 133. doi:10.1063/5.0147341
