Cite the Following Article
Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy
Nobuyuki Ishida
Beilstein J. Nanotechnol. 2022, 13, 1558–1563.
https://doi.org/10.3762/bjnano.13.129
How to Cite
Ishida, N. Beilstein J. Nanotechnol. 2022, 13, 1558–1563. doi:10.3762/bjnano.13.129
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Scholarly Works
- Ishida, N. Influence of Fermi level pinning on contact potential difference measurements using Kelvin probe force microscopy. Physical Review B 2025, 111. doi:10.1103/physrevb.111.125304
- Ishida, N.; Mano, T. Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy. Nanotechnology 2024, 36, 75701. doi:10.1088/1361-6528/ad960e
- Ishida, N.; Mano, T. Quantitative characterization of built-in potential profile across GaAs p-n junctions using Kelvin probe force microscopy with qPlus sensor AFM. Nanotechnology 2023, 35, 65708–065708. doi:10.1088/1361-6528/ad0b5e
