Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Masato Miyazaki, Yasuhiro Sugawara and Yan Jun Li
Beilstein J. Nanotechnol. 2022, 13, 712–720. https://doi.org/10.3762/bjnano.13.63

Cite the Following Article

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy
Masato Miyazaki, Yasuhiro Sugawara and Yan Jun Li
Beilstein J. Nanotechnol. 2022, 13, 712–720. https://doi.org/10.3762/bjnano.13.63

How to Cite

Miyazaki, M.; Sugawara, Y.; Li, Y. J. Beilstein J. Nanotechnol. 2022, 13, 712–720. doi:10.3762/bjnano.13.63

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.

Presentation Graphic

Picture with graphical abstract, title and authors for social media postings and presentations.
Format: PNG Size: 10.6 MB Download

Citations to This Article

Up to 20 of the most recent references are displayed here.

Scholarly Works

  • Miyazaki, M.; Sugawara, Y.; Li, Y. J. Dual-bias modulation heterodyne Kelvin probe force microscopy in FM mode. Applied Physics Letters 2022, 121, 241602. doi:10.1063/5.0129433
Other Beilstein-Institut Open Science Activities