A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

Hao Liu, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru and Hans J. Hug
Beilstein J. Nanotechnol. 2022, 13, 1120–1140. https://doi.org/10.3762/bjnano.13.95

Cite the Following Article

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy
Hao Liu, Zuned Ahmed, Sasa Vranjkovic, Manfred Parschau, Andrada-Oana Mandru and Hans J. Hug
Beilstein J. Nanotechnol. 2022, 13, 1120–1140. https://doi.org/10.3762/bjnano.13.95

How to Cite

Liu, H.; Ahmed, Z.; Vranjkovic, S.; Parschau, M.; Mandru, A.-O.; Hug, H. J. Beilstein J. Nanotechnol. 2022, 13, 1120–1140. doi:10.3762/bjnano.13.95

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