Supporting Information
Section S1: Height images of the scanned specimens of calibration standard grating within 10 µm × 10 µm. Section S2: Height images of the scanned corners of the calibration gate at smaller areas. Section S3: Nonlinear regression function used for determining the tip radii.
| Supporting Information File 1: Additional experimental data. | ||
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Cite the Following Article
Determination of the radii of coated and uncoated silicon AFM sharp tips using a height calibration standard grating and a nonlinear regression function
Perawat Boonpuek and Jonathan R. Felts
Beilstein J. Nanotechnol. 2023, 14, 1200–1207.
https://doi.org/10.3762/bjnano.14.99
How to Cite
Boonpuek, P.; Felts, J. R. Beilstein J. Nanotechnol. 2023, 14, 1200–1207. doi:10.3762/bjnano.14.99
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