Supporting Information
| Supporting Information File 1: Post-measurement topography verification and reproducibility tests on multiple sample regions. | ||
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Cite the Following Article
Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization
Yanping Wei, Jiafeng Shen, Yirong Yao, Xuke Li, Ming Li and Peiling Ke
Beilstein J. Nanotechnol. 2025, 16, 2077–2085.
https://doi.org/10.3762/bjnano.16.142
How to Cite
Wei, Y.; Shen, J.; Yao, Y.; Li, X.; Li, M.; Ke, P. Beilstein J. Nanotechnol. 2025, 16, 2077–2085. doi:10.3762/bjnano.16.142
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