Cite the Following Article
Correction: AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode
Hendrik Müller, Hartmut Stadler, Teresa de los Arcos, Adrian Keller and Guido Grundmeier
Beilstein J. Nanotechnol. 2025, 16, 252–253.
https://doi.org/10.3762/bjnano.16.19
How to Cite
Müller, H.; Stadler, H.; de los Arcos, T.; Keller, A.; Grundmeier, G. Beilstein J. Nanotechnol. 2025, 16, 252–253. doi:10.3762/bjnano.16.19
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