Cite the Following Article
Characterization of ion track-etched conical nanopores in thermal and PECVD SiO2 using small angle X-ray scattering
Shankar Dutt, Rudradeep Chakraborty, Christian Notthoff, Pablo Mota-Santiago, Christina Trautmann and Patrick Kluth
Beilstein J. Nanotechnol. 2025, 16, 899–909.
https://doi.org/10.3762/bjnano.16.68
How to Cite
Dutt, S.; Chakraborty, R.; Notthoff, C.; Mota-Santiago, P.; Trautmann, C.; Kluth, P. Beilstein J. Nanotechnol. 2025, 16, 899–909. doi:10.3762/bjnano.16.68
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Scholarly Works
- Afrin, N.; Dutt, S.; Kiy, A.; Craig, V.; Toimil-Molares, M. E.; Kluth, P. Charge-Based Molecular Separation Using Conical Nanopores in SiO 2 Membranes. ACS Applied Nano Materials 2025, 8, 20219–20229. doi:10.1021/acsanm.5c02992
