Cite the Following Article
Characterization of ion track-etched conical nanopores in thermal and PECVD SiO2 using small angle X-ray scattering
Shankar Dutt, Rudradeep Chakraborty, Christian Notthoff, Pablo Mota-Santiago, Christina Trautmann and Patrick Kluth
Beilstein J. Nanotechnol. 2025, 16, 899–909.
https://doi.org/10.3762/bjnano.16.68
How to Cite
Dutt, S.; Chakraborty, R.; Notthoff, C.; Mota-Santiago, P.; Trautmann, C.; Kluth, P. Beilstein J. Nanotechnol. 2025, 16, 899–909. doi:10.3762/bjnano.16.68
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Scholarly Works
- Ishikawa, N.; Taguchi, T.; Ogawa, H.; Toimil-Molares, M. E.; Trautmann, C. Track morphology in Si O 2 quartz irradiated with swift heavy ions: Thickness and edge effects. Physical Review Materials 2026, 10. doi:10.1103/gw8s-vl18
- Wierbik, J.; Heimes, H.; Notthoff, C.; Dutt, S.; Alwadi, T.; Kiy, A.; Mota-Santiago, P.; Kirby, N.; Kluth, P. Anisotropic fine structure of ion tracks in single crystals. Physical Review B 2026, 113. doi:10.1103/66z7-gjzq
- Afrin, N.; Dutt, S.; Kiy, A.; Craig, V.; Toimil-Molares, M. E.; Kluth, P. Charge-Based Molecular Separation Using Conical Nanopores in SiO 2 Membranes. ACS Applied Nano Materials 2025, 8, 20219–20229. doi:10.1021/acsanm.5c02992
