Cite the Following Article
Characterization of ion track-etched conical nanopores in thermal and PECVD SiO2 using small angle X-ray scattering
Shankar Dutt, Rudradeep Chakraborty, Christian Notthoff, Pablo Mota-Santiago, Christina Trautmann and Patrick Kluth
Beilstein J. Nanotechnol. 2025, 16, 899–909.
https://doi.org/10.3762/bjnano.16.68
How to Cite
Dutt, S.; Chakraborty, R.; Notthoff, C.; Mota-Santiago, P.; Trautmann, C.; Kluth, P. Beilstein J. Nanotechnol. 2025, 16, 899–909. doi:10.3762/bjnano.16.68
Download Citation
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window
below.
Citation data in RIS format can be imported by all major citation management software, including EndNote,
ProCite, RefWorks, and Zotero.
Presentation Graphic
| Picture with graphical abstract, title and authors for social media postings and presentations. | ||
| Format: PNG | Size: 9.1 MB | Download |
