Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

Sergei Magonov and John Alexander
Beilstein J. Nanotechnol. 2011, 2, 15–27. https://doi.org/10.3762/bjnano.2.2

Cite the Following Article

Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials
Sergei Magonov and John Alexander
Beilstein J. Nanotechnol. 2011, 2, 15–27. https://doi.org/10.3762/bjnano.2.2

How to Cite

Magonov, S.; Alexander, J. Beilstein J. Nanotechnol. 2011, 2, 15–27. doi:10.3762/bjnano.2.2

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.

Citations to This Article

Up to 20 of the most recent references are displayed here.

Scholarly Works

  • Gainutdinov, R. V.; Tolstikhina, A. L.; Selezneva, E. V.; Makarova, I. P. Microscopic Analysis of the Surface of Potassium-Ammonium Sulfate Acid Salt Crystals. Crystallography Reports 2022, 67, 412–420. doi:10.1134/s1063774522030087
  • Wang, S.; Luo, Z.; Liang, J.; Peng, S.; Hu, J.; He, J.; Li, Q. Nanoscale mapping of electric polarizability in a heterogeneous dielectric material with surface irregularities. Nanotechnology 2021, 32, 505711. doi:10.1088/1361-6528/ac26ff
  • Wenderott, J. K.; Dong, B. X.; Amonoo, J. A.; Green, P. F. Quantification of Interactions at the Polymer–Substrate Interface: Implications for Nanoscale Behavior. Macromolecules 2021, 54, 6257–6266. doi:10.1021/acs.macromol.1c00517
  • Dinelli, F.; Fabbri, F.; Forti, S.; Coletti, C.; Kolosov, O.; Pingue, P. Scanning Probe Spectroscopy of WS2/Graphene Van Der Waals Heterostructures. Nanomaterials (Basel, Switzerland) 2020, 10, 2494. doi:10.3390/nano10122494
  • Sazanova, T. S.; Otvagina, K. V.; Kryuchkov, S. S.; Zarubin, D. M.; Fukina, D.; Vorotyntsev, A. V.; Vorotyntsev, I. V. Revealing the Surface Effect on Gas Transport and Mechanical Properties in Nonporous Polymeric Membranes in Terms of Surface Free Energy. Langmuir : the ACS journal of surfaces and colloids 2020, 36, 12911–12921. doi:10.1021/acs.langmuir.0c02140
  • Gainutdinov, R. V.; Tolstikhina, A. L.; Lashkova, A. K.; Belugina, N. V.; Shut, V. N.; Mozzharov, S. E.; Kashevich, I. F. Application of Scanning Capacitance Force Microscopy for Detecting Impurity Phases in Ferroelectric Triglycine Sulfate. Technical Physics 2019, 64, 1602–1608. doi:10.1134/s1063784219110094
  • Indira, K.; Vanithakumari, S.; Mudali, U. K.; Mallika, C. Probing the Stability of Superhydrophobic (SHP) Silane Coating on Anodized Ti Substrate Using Kelvin Probe Force Microscope (KPFM). Transactions of the Indian Institute of Metals 2019, 72, 3045–3055. doi:10.1007/s12666-019-01770-5
  • Gainutdinov, R. V.; Belugina, N. V.; Lashkova, A. K.; Shut, V. N.; Kashevich, I. F.; Mozzharov, S. E.; Tolstikhina, A. L. Scanning capacitance microscopy of TGS − TGS + Cr ferroelectric crystals. Ferroelectrics 2019, 541, 39–46. doi:10.1080/00150193.2019.1574640
  • Yin, J.; Nysten, B. Contact electrification and charge decay on polyester fibres: A KPFM study. Journal of Electrostatics 2018, 96, 16–22. doi:10.1016/j.elstat.2018.09.002
  • Yin, J.; Vanderheyden, B.; Nysten, B. Dynamic charge transfer between polyester and conductive fibres by Kelvin probe force microscopy. Journal of Electrostatics 2018, 96, 30–39. doi:10.1016/j.elstat.2018.09.006
  • Collins, L.; Kilpatrick, J. I.; Kalinin, S. V.; Rodriguez, B. J. Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review. Reports on progress in physics. Physical Society (Great Britain) 2018, 81, 086101. doi:10.1088/1361-6633/aab560
  • Sazanova, T. S.; Otvagina, K. V.; Vorotyntsev, I. V. The contributions of supramolecular organization to mechanical properties of chitosan and chitosan copolymers with synthetic polymers according to atomic force microscopy. Polymer Testing 2018, 68, 350–358. doi:10.1016/j.polymertesting.2018.04.031
  • Alexander, J.; Belikov, S.; Magonov, S. AFM-Based Characterization of Electrical Properties of Materials. Methods in molecular biology (Clifton, N.J.) 2018, 1814, 99–127. doi:10.1007/978-1-4939-8591-3_7
  • Kim, J. Y.; Han, M.-G.; Lien, M.-B.; Magonov, S.; Zhu, Y.; George, H.; Norris, T. B.; Kotov, N. A. Dipole-like electrostatic asymmetry of gold nanorods. Science advances 2018, 4, e1700682. doi:10.1126/sciadv.1700682
  • Magonov, S.; Wu, S. Expanding Functionality of Atomic Force Microscopy with High-Speed Environmental Studies. MRS Advances 2018, 3, 587–593. doi:10.1557/adv.2018.77
  • Hegemann, D.; Hocquard, N.; Heuberger, M. Nanoconfined water can orient and cause long-range dipolar interactions with biomolecules. Scientific reports 2017, 7, 17852. doi:10.1038/s41598-017-18258-1
  • Belikov, S.; Alexander, J.; Surtchev, M.; Malovichko, I.; Magonov, S. ACC - Automatic probe landing in Atomic Force Microscopy resonance modes. In 2017 American Control Conference (ACC), IEEE, 2017; pp 2894–2899. doi:10.23919/acc.2017.7963390
  • Bercu, N.; Giraudet, L.; Simonetti, O.; Molinari, M. Development of an improved Kelvin probe force microscope for accurate local potential measurements on biased electronic devices. Journal of microscopy 2017, 267, 272–279. doi:10.1111/jmi.12563
  • Riba-Moliner, M.; Avarvari, N.; Amabilino, D. B.; González-Campo, A.; Gómez, A. Distinguishing between Mechanical and Electrostatic Interaction in Single Pass Multi Frequency Electrostatic Force Microscopy Measurements on a Molecular Material. Langmuir : the ACS journal of surfaces and colloids 2016, 32, 13593–13599. doi:10.1021/acs.langmuir.6b03390
  • Magonov, S.; Alexander, J.; Surtchev, M.; Hung, A. M.; Fini, E. H. Compositional mapping of bitumen using local electrostatic force interactions in atomic force microscopy. Journal of microscopy 2016, 265, 196–206. doi:10.1111/jmi.12475

Patents

  • PIEPER HANS HERMANN; BAUR CHRISTOF; FETTIG RAINER. Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope. US 9995764 B2, June 12, 2018.
  • PIEPER HANS HERRMANN; BAUR CHRISTOF; FETTIG RAINER. Verfahren und Vorrichtung zum Vermeiden von Schäden beim Analysieren einer Probenoberfläche mit einem Rastersondenmikroskop. DE 102016204034 A1, Sept 14, 2017.
Other Beilstein-Institut Open Science Activities