Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

Sergei Magonov and John Alexander
Beilstein J. Nanotechnol. 2011, 2, 15–27.

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Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials
Sergei Magonov and John Alexander
Beilstein J. Nanotechnol. 2011, 2, 15–27.

How to Cite

Magonov, S.; Alexander, J. Beilstein J. Nanotechnol. 2011, 2, 15–27. doi:10.3762/bjnano.2.2

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