Repulsive bimodal atomic force microscopy on polymers

Alexander M. Gigler, Christian Dietz, Maximilian Baumann, Nicolás F. Martinez, Ricardo García and Robert W. Stark
Beilstein J. Nanotechnol. 2012, 3, 456–463. https://doi.org/10.3762/bjnano.3.52

Cite the Following Article

Repulsive bimodal atomic force microscopy on polymers
Alexander M. Gigler, Christian Dietz, Maximilian Baumann, Nicolás F. Martinez, Ricardo García and Robert W. Stark
Beilstein J. Nanotechnol. 2012, 3, 456–463. https://doi.org/10.3762/bjnano.3.52

How to Cite

Gigler, A. M.; Dietz, C.; Baumann, M.; Martinez, N. F.; García, R.; Stark, R. W. Beilstein J. Nanotechnol. 2012, 3, 456–463. doi:10.3762/bjnano.3.52

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