Peak forces and lateral resolution in amplitude modulation force microscopy in liquid

Scholarly Works

• Menacho, W.; Catalan, K. N.; Corrales, T. P.; Guzman, H. V. Quantitative Dynamic AFM Hydration‐Adsorption Design for Hygroscopic and Bio‐Compatible Polymeric Nanofibers. Small Structures 2024. doi:10.1002/sstr.202300379
• Moreira, R. A.; Baker, J. L.; Guzman, H. V.; Poma, A. B. Assessing the Stability of Biological Fibrils by Molecular-Scale Simulations. Methods in molecular biology (Clifton, N.J.) 2022, 2340, 357–378. doi:10.1007/978-1-0716-1546-1_16
• Hoogesteger, M.; Sadeghian, H.; Nijmeijer, H. AIM - The Sensitivity of Subsurface Contact Resonance Atomic Force Microscopy to Changes in the Depth of Buried Features: a Nonlinear Approach. In 2021 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), IEEE, 2021; pp 110–115. doi:10.1109/aim46487.2021.9517484
• Hu, X.; Yang, Q.; Ye, T.; Martini, A. Simulation of Subnanometer Contrast in Dynamic Atomic Force Microscopy of Hydrophilic Alkanethiol Self-Assembled Monolayers in Water. Langmuir : the ACS journal of surfaces and colloids 2020, 36, 2240–2246. doi:10.1021/acs.langmuir.9b03655
• Wang, W.; Ma, C.; Chen, Y.; Zheng, L.; Liu, H.; Chu, J. Subsurface imaging of flexible circuits via contact resonance atomic force microscopy. Beilstein journal of nanotechnology 2019, 10, 1636–1647. doi:10.3762/bjnano.10.159
• Guzman, H. V. Scaling law to determine peak forces in tapping-mode AFM experiments on finite elastic soft matter systems. Beilstein journal of nanotechnology 2017, 8, 968–974. doi:10.3762/bjnano.8.98
• Legrand, B.; Salvetat, J.-P.; Walter, B.; Faucher, M.; Theron, D.; Aimé, J.-P. Multi-MHz micro-electro-mechanical sensors for atomic force microscopy. Ultramicroscopy 2017, 175, 46–57. doi:10.1016/j.ultramic.2017.01.005
• Keyvani, A.; Tamer, M. S.; van Es, M. H.; Sadeghian, H. Simultaneous AFM nano-patterning and imaging for photomask repair. SPIE Proceedings 2016, 9778, 977818. doi:10.1117/12.2219041
• Lai, C.-Y.; Barcons, V.; Santos, S.; Chiesa, M. Periodicity in bimodal atomic force microscopy. Journal of Applied Physics 2015, 118, 044905. doi:10.1063/1.4927733
• Keyvani, A.; Sadeghian, H.; Goosen, H.; van Keulen, F. Transient Tip-Sample Interactions in High-Speed AFM Imaging of 3D nano structures. SPIE Proceedings 2015, 9424, 858–867. doi:10.1117/12.2185848
• Sadeghian, H.; van den Dool, T. C.; Uziel, Y.; Or, R. B. High-speed AFM for 1x node metrology and inspection: does it damage the features?. SPIE Proceedings 2015, 9424, 263–272. doi:10.1117/12.2085668
• Van Der Hofstadt, M.; Hüttener, M.; Juárez, A.; Gomila, G. Nanoscale imaging of the growth and division of bacterial cells on planar substrates with the atomic force microscope. Ultramicroscopy 2015, 154, 29–36. doi:10.1016/j.ultramic.2015.02.018
• Guzman, H. V.; García, P. D.; Garcia, R. Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments. Beilstein journal of nanotechnology 2015, 6, 369–379. doi:10.3762/bjnano.6.36
• Glatzel, T.; Hölscher, H.; Schimmel, T.; Baykara, M. Z.; Schwarz, U. D.; Garcia, R. Advanced atomic force microscopy techniques II. Beilstein journal of nanotechnology 2014, 5, 2326–2327. doi:10.3762/bjnano.5.241

Explore citations to this article at