Advanced atomic force microscopy techniques II

Thilo Glatzel, Ricardo Garcia and Thomas Schimmel
Beilstein J. Nanotechnol. 2014, 5, 2326–2327. https://doi.org/10.3762/bjnano.5.241

Cite the Following Article

Advanced atomic force microscopy techniques II
Thilo Glatzel, Ricardo Garcia and Thomas Schimmel
Beilstein J. Nanotechnol. 2014, 5, 2326–2327. https://doi.org/10.3762/bjnano.5.241

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Glatzel, T.; Garcia, R.; Schimmel, T. Beilstein J. Nanotechnol. 2014, 5, 2326–2327. doi:10.3762/bjnano.5.241

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