Beilstein J. Nanotechnol. 2014, 5, 26–35. doi:10.3762/bjnano.5.3
Additional AFM images are provided that include lateral force frames and images acquired at other selected time points during surface self-assembly (Figures S1, S2, S3 and S4).
Supporting Information File 1: Additional AFM images. | ||
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Thilo Glatzel and Thomas Schimmel