Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM

Mohamed N. Ghazzal, Robert Wojcieszak, Gijo Raj and Eric M. Gaigneaux
Beilstein J. Nanotechnol. 2014, 5, 68–76. https://doi.org/10.3762/bjnano.5.6

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Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM
Mohamed N. Ghazzal, Robert Wojcieszak, Gijo Raj and Eric M. Gaigneaux
Beilstein J. Nanotechnol. 2014, 5, 68–76. https://doi.org/10.3762/bjnano.5.6

How to Cite

Ghazzal, M. N.; Wojcieszak, R.; Raj, G.; Gaigneaux, E. M. Beilstein J. Nanotechnol. 2014, 5, 68–76. doi:10.3762/bjnano.5.6

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