Correction to "Energy dissipation in multifrequency atomic force microscopy"
Dipartimento di Fisica, Università degli Studi di Milano, I-20122 Milano, Italy
Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy
Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy
Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy
1Dipartimento di Fisica, Università degli Studi di Milano, I-20122 Milano, Italy
2Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy
This article is part of the Thematic Series "Noncontact atomic force microscopy II".
Guest Editors: U. D. Schwarz and M. Z. Baykara
Beilstein J. Nanotechnol. 2014, 5, 667. https://doi.org/10.3762/bjnano.5.78
Received 14 May 2014,
Accepted 14 May 2014,
Published 20 May 2014
- Correction
Keywords: band excitation; multifrequency atomic force microscopy (AFM); phase reference; wavelet transforms
In the section "Energy dissipation" of the above manuscript, there is a typesetting error in the mathematical expressions after Equation 5. The correct form must be:
The energy balance of each decaying mode obtained from Equation 4 in the time window 0 < t < τ = 200 μs (see Figure 1) can be written as
![[Graphic 1]](/bjnano/content/inline/2190-4286-5-78-i1.svg?max-width=637&scale=1.18182)
where
![[Graphic 2]](/bjnano/content/inline/2190-4286-5-78-i2.svg?max-width=637&scale=1.18182)
i is the index of the mode, ΔKi = 1/2 meq(vi(0)2 − vi(τ)2) is the variation of kinetic energy, and ΔUi = 1/2 ki(zi(0)2 − zi(τ)2) is the variation of elastic potential energy.
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