Correction to "Energy dissipation in multifrequency atomic force microscopy"

  1. Valentina Pukhova1,2,
  2. Francesco Banfi2 and
  3. Gabriele Ferrini2

1Dipartimento di Fisica, Università degli Studi di Milano, I-20122 Milano, Italy
2Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy

  1. Corresponding author email

This article is part of the Thematic Series "Noncontact atomic force microscopy II".

Guest Editors: U. D. Schwarz and M. Z. Baykara
Beilstein J. Nanotechnol. 2014, 5, 667.
Received 14 May 2014, Accepted 14 May 2014, Published 20 May 2014

Keywords: band excitation; multifrequency atomic force microscopy (AFM); phase reference; wavelet transforms

In the section "Energy dissipation" of the above manuscript, there is a typesetting error in the mathematical expressions after Equation 5. The correct form must be:

The energy balance of each decaying mode obtained from Equation 4 in the time window 0 < t < τ = 200 μs (see Figure 1) can be written as

[Graphic 1]


[Graphic 2]

i is the index of the mode, ΔKi = 1/2 meq(vi(0)2 − vi(τ)2) is the variation of kinetic energy, and ΔUi = 1/2 ki(zi(0)2zi(τ)2) is the variation of elastic potential energy.

© 2014 Pukhova et al; licensee Beilstein-Institut.
This is an Open Access article under the terms of the Creative Commons Attribution License (, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (

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