1Dipartimento di Fisica, Università degli Studi di Milano, I-20122 Milano, Italy
2Interdisciplinary Laboratories for Advanced Materials Physics (i-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica, I-25121 Brescia, Italy
This article is part of the Thematic Series "Noncontact atomic force microscopy II".
Guest Editors: U. D. Schwarz and M. Z. Baykara
Beilstein J. Nanotechnol. 2014, 5, 667. https://doi.org/10.3762/bjnano.5.78
Received 14 May 2014, Accepted 14 May 2014, Published 20 May 2014
Keywords: band excitation; multifrequency atomic force microscopy (AFM); phase reference; wavelet transforms
In the section "Energy dissipation" of the above manuscript, there is a typesetting error in the mathematical expressions after Equation 5. The correct form must be:
The energy balance of each decaying mode obtained from Equation 4 in the time window 0 < t < τ = 200 μs (see Figure 1) can be written as
i is the index of the mode, ΔKi = 1/2 meq(vi(0)2 − vi(τ)2) is the variation of kinetic energy, and ΔUi = 1/2 ki(zi(0)2 − zi(τ)2) is the variation of elastic potential energy.
© 2014 Pukhova et al; licensee Beilstein-Institut.
This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (http://www.beilstein-journals.org/bjnano)
Subscribe to our Latest Articles RSS Feed.Subscribe
Follow the Beilstein-Institut