Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

Tino Wagner, Hannes Beyer, Patrick Reissner, Philipp Mensch, Heike Riel, Bernd Gotsmann and Andreas Stemmer

Beilstein J. Nanotechnol. 2015, 6, 2193–2206. doi:10.3762/bjnano.6.225

Supporting Information

Supporting Information File 1: Detailed derivations of the effective forces and the state-space KFM controller.
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Advanced atomic force microscopy techniques IV

Thilo Glatzel

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