Beilstein J. Nanotechnol. 2015, 6, 711–719. doi:10.3762/bjnano.6.72
See Supporting Information for the Raman spectra of the different graphene materials (exfoliated, graphene on the C-face of SiC, turbostratic micro-discs deposited on SiO2); the AFM characterization of the graphene grown on SiC; additional details about the fitting procedure of the non linear I–V curves according to the Simmons model.
Supporting Information File 1: Titel: Material characterization. | ||
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Mario Ruben