Cite the Following Article
An ellipsometric approach towards the description of inhomogeneous polymer-based Langmuir layers
Falko O. Rottke, Burkhard Schulz, Klaus Richau, Karl Kratz and Andreas Lendlein
Beilstein J. Nanotechnol. 2016, 7, 1156–1165.
https://doi.org/10.3762/bjnano.7.107
How to Cite
Rottke, F. O.; Schulz, B.; Richau, K.; Kratz, K.; Lendlein, A. Beilstein J. Nanotechnol. 2016, 7, 1156–1165. doi:10.3762/bjnano.7.107
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