Cite the Following Article
Metal oxide-graphene field-effect transistor: interface trap density extraction model
Faraz Najam, Kah Cheong Lau, Cheng Siong Lim, Yun Seop Yu and Michael Loong Peng Tan
Beilstein J. Nanotechnol. 2016, 7, 1368–1376.
https://doi.org/10.3762/bjnano.7.128
How to Cite
Najam, F.; Lau, K. C.; Lim, C. S.; Yu, Y. S.; Tan, M. L. P. Beilstein J. Nanotechnol. 2016, 7, 1368–1376. doi:10.3762/bjnano.7.128
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