Cite the Following Article
Ion beam profiling from the interaction with a freestanding 2D layer
Ivan Shorubalko, Kyoungjun Choi, Michael Stiefel and Hyung Gyu Park
Beilstein J. Nanotechnol. 2017, 8, 682–687.
https://doi.org/10.3762/bjnano.8.73
How to Cite
Shorubalko, I.; Choi, K.; Stiefel, M.; Park, H. G. Beilstein J. Nanotechnol. 2017, 8, 682–687. doi:10.3762/bjnano.8.73
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