Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins

Gheorghe Stan, Richard S. Gates, Qichi Hu, Kevin Kjoller, Craig Prater, Kanwal Jit Singh, Ebony Mays and Sean W. King
Beilstein J. Nanotechnol. 2017, 8, 863–871. https://doi.org/10.3762/bjnano.8.88

Cite the Following Article

Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins
Gheorghe Stan, Richard S. Gates, Qichi Hu, Kevin Kjoller, Craig Prater, Kanwal Jit Singh, Ebony Mays and Sean W. King
Beilstein J. Nanotechnol. 2017, 8, 863–871. https://doi.org/10.3762/bjnano.8.88

How to Cite

Stan, G.; Gates, R. S.; Hu, Q.; Kjoller, K.; Prater, C.; Jit Singh, K.; Mays, E.; King, S. W. Beilstein J. Nanotechnol. 2017, 8, 863–871. doi:10.3762/bjnano.8.88

Download Citation

Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window below.
Citation data in RIS format can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Zotero.

Presentation Graphic

Picture with graphical abstract, title and authors for social media postings and presentations.
Format: PNG Size: 492.2 KB Download

Citations to This Article

Up to 20 of the most recent references are displayed here.

Scholarly Works

  • Stan, G.; Ciobanu, C. V.; King, S. W. Resolving the Subsurface Structure and Elastic Modulus of Layered Films via Contact Resonance Atomic Force Microscopy. ACS applied materials & interfaces 2022, 14, 55238–55248. doi:10.1021/acsami.2c17962
  • Stan, G.; King, S. W. Atomic force microscopy for nanoscale mechanical property characterization. Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 2020, 38, 060801. doi:10.1116/6.0000544
  • Jenkins, M. A.; Austin, D. Z.; Conley, J. F.; Fan, J.; de Groot, C.; Jiang, L.; Fan, Y.; Ali, R.; Ghosh, G.; Orlowski, M. K.; King, S. W. Review—Beyond the highs and lows: A perspective on the future of dielectrics research for nanoelectronic devices. ECS Journal of Solid State Science and Technology 2019, 8, N159–N185. doi:10.1149/2.0161910jss
  • Stan, G.; Mays, E.; Yoo, H. J.; King, S. W. Correction to: The Effect of Edge Compliance on the Contact between a Spherical Indenter and a High-Aspect-Ratio Rectangular Fin. Experimental Mechanics 2019, 1–11. doi:10.1007/s11340-019-00483-6
  • Su, Q.; Wang, T.; Gigax, J. G.; Shao, L.; Lanford, W. A.; Nastasi, M.; Li, L.; Bhattarai, G.; Paquette, M. M.; King, S. W. Influence of topological constraints on ion damage resistance of amorphous hydrogenated silicon carbide. Acta Materialia 2019, 165, 587–602. doi:10.1016/j.actamat.2018.12.016
  • Stan, G. The effect of edge compliance on the adhesive contact between a spherical indenter and a quarter-space. International journal of solids and structures 2019, 158, 165–175. doi:10.1016/j.ijsolstr.2018.09.006
  • Stan, G.; Mays, E.; Yoo, H.-J.; King, S. W. The Effect of Edge Compliance on the Contact between a Spherical Indenter and a High-Aspect-Ratio Rectangular Fin. Experimental mechanics 2018, 58, 1157–1167. doi:10.1007/s11340-018-0421-4
Other Beilstein-Institut Open Science Activities