Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing

Xiaomo Xu, Thomas Prüfer, Daniel Wolf, Hans-Jürgen Engelmann, Lothar Bischoff, René Hübner, Karl-Heinz Heinig, Wolfhard Möller, Stefan Facsko, Johannes von Borany and Gregor Hlawacek
Beilstein J. Nanotechnol. 2018, 9, 2883–2892. https://doi.org/10.3762/bjnano.9.267

Cite the Following Article

Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing
Xiaomo Xu, Thomas Prüfer, Daniel Wolf, Hans-Jürgen Engelmann, Lothar Bischoff, René Hübner, Karl-Heinz Heinig, Wolfhard Möller, Stefan Facsko, Johannes von Borany and Gregor Hlawacek
Beilstein J. Nanotechnol. 2018, 9, 2883–2892. https://doi.org/10.3762/bjnano.9.267

How to Cite

Xu, X.; Prüfer, T.; Wolf, D.; Engelmann, H.-J.; Bischoff, L.; Hübner, R.; Heinig, K.-H.; Möller, W.; Facsko, S.; von Borany, J.; Hlawacek, G. Beilstein J. Nanotechnol. 2018, 9, 2883–2892. doi:10.3762/bjnano.9.267

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