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Cite the Following Article
Nanoscale mapping of dielectric properties based on surface adhesion force measurements
Ying Wang, Yue Shen, Xingya Wang, Zhiwei Shen, Bin Li, Jun Hu and Yi Zhang
Beilstein J. Nanotechnol. 2018, 9, 900–906.
https://doi.org/10.3762/bjnano.9.84
How to Cite
Wang, Y.; Shen, Y.; Wang, X.; Shen, Z.; Li, B.; Hu, J.; Zhang, Y. Beilstein J. Nanotechnol. 2018, 9, 900–906. doi:10.3762/bjnano.9.84
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