Beilstein J. Nanotechnol. 2018, 9, 936–944. https://doi.org/10.3762/bjnano.9.86
Supporting Information File 1:
Additional experimental data.
Supporting information shows the control SEM image, detailed results of EIS measurements, detailed peak decomposition of ADXPS data, Raman spectra, and in situ spectroscopic ellipsometry data. |
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