Cite the Following Article
Scanning speed phenomenon in contact-resonance atomic force microscopy
Christopher C. Glover, Jason P. Killgore and Ryan C. Tung
Beilstein J. Nanotechnol. 2018, 9, 945–952.
https://doi.org/10.3762/bjnano.9.87
How to Cite
Glover, C. C.; Killgore, J. P.; Tung, R. C. Beilstein J. Nanotechnol. 2018, 9, 945–952. doi:10.3762/bjnano.9.87
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- Orudzhev, F. F.; Ramazanov, S. M.; Sobola, D.; Alikhanov, N. M. R.; Dallaev, R. S. Property Management of BiFeO3-Based Multifunctional Perovskite Nanomaterials: Nanoparticles, Ceramics, and Thin Films. Materials Horizons: From Nature to Nanomaterials; Springer Nature Singapore, 2022; pp 111–155. doi:10.1007/978-981-19-2639-6_6
- Flater, E. E.; Mugdha, A. C.; Gupta, S.; Hudson, W. A.; Fahrenkamp, A. A.; Killgore, J. P.; Wilson, J. W. Error estimation and enhanced stiffness sensitivity in contact resonance force microscopy with a multiple arbitrary frequency lock-in amplifier (MAFLIA). Measurement Science and Technology 2020, 31, 115009. doi:10.1088/1361-6501/ab97f9
- Dzedzickis, A. Vilnius Gediminas Technical University, 2019. doi:10.20334/2019-003-m
- Killgore, J. P.; DelRio, F. W. Contact Resonance Force Microscopy for Viscoelastic Property Measurements: From Fundamentals to State-of-the-Art Applications. Macromolecules 2018, 51, 6977–6996. doi:10.1021/acs.macromol.8b01178
