2 article(s) from Bischoff, Lothar

Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources

  1. Nico Klingner,
  2. Gregor Hlawacek,
  3. Paul Mazarov,
  4. Wolfgang Pilz,
  5. Fabian Meyer and
  6. Lothar Bischoff
  • Full Research Paper
  • Published 18 Nov 2020

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2020, 11, 1742–1749, doi:10.3762/bjnano.11.156

Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing

  1. Xiaomo Xu,
  2. Thomas Prüfer,
  3. Daniel Wolf,
  4. Hans-Jürgen Engelmann,
  5. Lothar Bischoff,
  6. René Hübner,
  7. Karl-Heinz Heinig,
  8. Wolfhard Möller,
  9. Stefan Facsko,
  10. Johannes von Borany and
  11. Gregor Hlawacek
  • Full Research Paper
  • Published 16 Nov 2018

  • PDF
Graphical Abstract

Beilstein J. Nanotechnol. 2018, 9, 2883–2892, doi:10.3762/bjnano.9.267

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