3 article(s) from Blumenstein, Nina J
AFM height images of the COOH-SAM (a) and the PEL (b).
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AFM topography images of the ZnO films deposited onto COOH-terminated SAM (a) and PEL (d) after 3 d...
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X-ray diffractograms of ZnO films deposited on carboxylate-SAM (black) and PEL (grey). The enhanced...
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PFM amplitude 1 images obtained by applying voltages of 2 to 10 V of the deposited films on COOH-SA...
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Cross-sections of the amplitude 1 images taken at 10 V for ZnO films deposited on COOH-SAM (black) ...
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Quantitative analysis of the piezoelectric responses of ZnO films deposited on carboxylate-SAM (a) ...
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Beilstein J. Nanotechnol. 2017, 8, 296–303, doi:10.3762/bjnano.8.32
a) Structural formula of the α-methyl-ω-p-vinyl-benzoate-polystyrene molecule. b) Schematic represe...
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AFM height images and corresponding cross sections of a) a Si wafer and b) a PS brush.
ζ-potential of the Si wafer and the PS brush before and after modification measured in water.
Mechanism of the proposed transesterification process, which modifies the polystyrene brush in the ...
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ATR spectra of PS powder used for the preparation of the brushes before and after modification. The...
XRD diagrams of ZnO films deposited on a) SiOx and b) PS brushes after 20 mineralization cycles. Th...
a) AFM topography and cross section of ZnO islands deposited on SiOx after 20 mineralization cycles...
Beilstein J. Nanotechnol. 2016, 7, 102–110, doi:10.3762/bjnano.7.12
Self-assembly of ZnO-containing material on prepatterned substrates. (a) Schematic representation o...
Deposition mechanism of mineralized ZnO nanoparticles on amino SAMs. The negative charges represent...
Beilstein J. Nanotechnol. 2015, 6, 1763–1768, doi:10.3762/bjnano.6.180
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