3 article(s) from Blumenstein, Nina J
- Full Research Paper
- Published 30 Jan 2017
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Figure 1: AFM height images of the COOH-SAM (a) and the PEL (b).
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Figure 2: AFM topography images of the ZnO films deposited onto COOH-terminated SAM (a) and PEL (d) after 3 d...
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Figure 3: X-ray diffractograms of ZnO films deposited on carboxylate-SAM (black) and PEL (grey). The enhanced...
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Figure 4: PFM amplitude 1 images obtained by applying voltages of 2 to 10 V of the deposited films on COOH-SA...
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Figure 5: Cross-sections of the amplitude 1 images taken at 10 V for ZnO films deposited on COOH-SAM (black) ...
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Figure 6: Quantitative analysis of the piezoelectric responses of ZnO films deposited on carboxylate-SAM (a) ...
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- Full Research Paper
- Published 25 Jan 2016
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Scheme 1: a) Structural formula of the α-methyl-ω-p-vinyl-benzoate-polystyrene molecule. b) Schematic represe...
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Figure 1: AFM height images and corresponding cross sections of a) a Si wafer and b) a PS brush.
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Figure 2: ζ-potential of the Si wafer and the PS brush before and after modification measured in water.
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Scheme 2: Mechanism of the proposed transesterification process, which modifies the polystyrene brush in the ...
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Figure 3: ATR spectra of PS powder used for the preparation of the brushes before and after modification. The...
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Figure 4: XRD diagrams of ZnO films deposited on a) SiOx and b) PS brushes after 20 mineralization cycles. Th...
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Figure 5: a) AFM topography and cross section of ZnO islands deposited on SiOx after 20 mineralization cycles...
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