2 article(s) from Bock, Wolfgang

Absence of free carriers in silicon nanocrystals grown from phosphorus- and boron-doped silicon-rich oxide and oxynitride

  1. Daniel Hiller,
  2. Julian López-Vidrier,
  3. Keita Nomoto,
  4. Michael Wahl,
  5. Wolfgang Bock,
  6. Tomáš Chlouba,
  7. František Trojánek,
  8. Sebastian Gutsch,
  9. Margit Zacharias,
  10. Dirk König,
  11. Petr Malý and
  12. Michael Kopnarski
  • Full Research Paper
  • Published 18 May 2018

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2018, 9, 1501–1511, doi:10.3762/bjnano.9.141

Precise in situ etch depth control of multilayered III−V semiconductor samples with reflectance anisotropy spectroscopy (RAS) equipment

  1. Ann-Kathrin Kleinschmidt,
  2. Lars Barzen,
  3. Johannes Strassner,
  4. Christoph Doering,
  5. Henning Fouckhardt,
  6. Wolfgang Bock,
  7. Michael Wahl and
  8. Michael Kopnarski
  • Full Research Paper
  • Published 21 Nov 2016

  • PDF

Beilstein J. Nanotechnol. 2016, 7, 1783–1793, doi:10.3762/bjnano.7.171

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