1 article(s) from Bollmann, T. R. J.
Micro-Raman spectrum for both, the substrate and the SLG flake introduced in Figure 3. The inset shows the ...
Jump to Figure 1
Roughness analysis of NC-AFM images taken on a single terrace within 70 × 70 nm2 on the 6H-SiC(0001...
Jump to Figure 2
Tapping mode AFM image (a) of an exfoliated SLG flake on 6H-SiC(0001) showing examples of rupture a...
Jump to Figure 3
NC-AFM image (a) of an exfoliated SLG flake on 6H-SiC(0001), irradiated with SHI and subjected to p...
Jump to Figure 4
(a) LCPD image of the folding marked by A in Figure 4. (b) The profile taken in the corresponding NC-AFM im...
Jump to Figure 5
(a) NC-AFM image of the region marked by B in Figure 4, where post-preparation treatment resulted in the fo...
Jump to Figure 6
NC-AFM image of the region marked C in Figure 4 with foldings due to SHI impact on the left and right of th...
Jump to Figure 7
Beilstein J. Nanotechnol. 2013, 4, 625–631, doi:10.3762/bjnano.4.69
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut