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Beilstein J. Nanotechnol. 2017, 8, 467–474, doi:10.3762/bjnano.8.50
Figure 1: a) Comparison between tapping mode atomic force microscopy (tAFM) morphologies of low temperature (...
Figure 2: a) Tapping mode atomic force microscopy (tAFM) morphology of the PEN surface and b) a schematic rep...
Figure 3: a) Tapping mode atomic force microscopy (tAFM) morphology and b) schematic illustration of the alum...
Figure 4: a) Tapping mode atomic force microscopy (tAFM) morphology and b) schematic illustration of the grap...
Figure 5: a) Id–Vd characteristics at different back gate bias values and b) Id–Vg transfer characteristic fo...
Figure 6: Transfer conductance, gm, of the Gr-FET, calculated from the Id vs Vg transfer characteristic.