1 article(s) from Chatterjee, Atasi
(a) Typical SEM image of a 5 nm thick, nanocrystalline Ag bow-tie structure before EM and (b) after...
Jump to Figure 1
Conductance histogram with values between 2G0 and 15G0 of conductance traces obtained during EM-ind...
Jump to Figure 2
Fourier transform of the conductance histogram of Figure 2 of bow-tie electromigrated structures. The x-axi...
Jump to Figure 3
Conductance histogram of 15 conductance traces obtained during EM of FIB-patterned bow-tie structur...
Jump to Figure 4
FT of conductance histogram of FIB-patterned structures shown in Figure 4. The x-axis represents the Fourie...
Jump to Figure 5
Beilstein J. Nanotechnol. 2020, 11, 680–687, doi:10.3762/bjnano.11.55
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut