2 article(s) from Chu, Jiaru
Figure 1: (a) Schematic illustration of CR-AFM imaging on the flexible circuit sample. (b) An enlarged sectio...
Figure 2: Subsurface imaging of the flexible circuit sample with a top layer thickness of 52 nm measured via ...
Figure 3: Influence of the applied force on CR-AFM subsurface imaging of the flexible circuit sample with a 5...
Figure 4: Influence of cantilever stiffness on CR-AFM subsurface imaging of the flexible circuit sample with ...
Figure 5: The influence of cantilever oscillation eigenmode on CR-AFM subsurface imaging of a flexible circui...
Figure 6: Influence of cover thickness on CR-AFM subsurface imaging of the circuit sample. (a–e) Frequency im...
Figure 7: Influence of thickness and material properties of each layer on subsurface imaging of the circuit p...
Figure 8: Optimization of CR-AFM subsurface imaging on a flexible circuit sample. (a,b) CR-AFM frequency imag...
Figure 9: Subsurface imaging of defects in the buried circuit pattern using CR-AFM. (a) Schematic illustratio...
Figure 1: Typical sixth harmonic amplitude images of a PS/LDPE blend with different amplitude set-points. (a)...
Figure 2: Dependence of the sixth harmonic amplitude on the set-point. (a) Experimental results. (b) Numerica...
Figure 3: Influence of drive frequency on the sixth harmonic amplitude. The fundamental free resonance freque...
Figure 4: Harmonic amplitude contrast reversal when the drive frequency is altered. (a) Amplitude difference ...
Figure 5: Typical harmonic amplitude images when the laser spot location on the cantilever beam is changed. T...
Figure 6: Relation between the harmonic amplitude difference and the slope of the corresponding cantilever mo...
Figure 7: AFM images of mixed PS and SiO2 NPs on a silicon substrate. (a) Topography. (b) The 6th harmonic am...
Figure 8: Harmonic AFM imaging of SiO2/PS NPs mixed with different ratios. The two types of NPs have the same...
Figure 9: Mixture ratio estimation of the SiO2/PS composites.