1 article(s) from Colchero, Jaime
AFM images (a, c) and optical image (b) of the tip side of an Olympus OMCL-HA-100 AFM cantilever. I...
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Topography (a), error signal (b), capacity data (c) and contact potential (e) acquired on the flat ...
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Topography images and spectroscopy data at specific locations on three different Pt-coated cantilev...
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Beilstein J. Nanotechnol. 2018, 9, 2925–2935, doi:10.3762/bjnano.9.271
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