1 article(s) from Craciun, Doina
Cross-sectional SEM images of the cleaved as-deposited (a,c,e) and RTA-processed (b,d,f) ITO films,...
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XRD patterns for the as-deposited and RTA-processed ITO samples.
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XPS survey spectra in the range 0–1250 eV acquired from the as-deposited and RTA-treated ITO sample...
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High-resolution a) In 3d, b) Sn 3d and c) O 1s XPS spectra acquired from as-deposited and RTA-treat...
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Optical transmission spectra for the as-deposited and RTA-treated ITO samples with interference max...
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a) Refractive index dependence on the wavelength (dispersion) and b) extinction coefficient depende...
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Dependence of (αhν)2 = f(hν) on the energy of the incident photons, for the as-deposited and RTA-tr...
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Optical conductivity dependence on the energy of the incident photons for the as-deposited and RTA-...
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Photon energy dependence of the a) real and b) imaginary part of the complex dielectric permittivit...
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Beilstein J. Nanotechnol. 2019, 10, 1511–1522, doi:10.3762/bjnano.10.149
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