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3 article(s) from Egberts, Philip

Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis

Thomas Mathias,
Roland Bennewitz and
Philip Egberts

Beilstein J. Nanotechnol. 2025, 16, 1952–1962, doi:10.3762/bjnano.16.136

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Figure 1: (a) Schematic diagrams of the cantilever models used in determining the dispersion curves to conver...

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Figure 2: (a) Force-versus-displacement curve using the high-sample rate acquisition system. (b) Fourier tran...

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Figure 3: (a) Resonant frequency versus normal force determined from fits of the first normal resonant mode p...

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Figure 4: Experimental data for four sample combinations tested (silicon tips on HOPG, diamond-coated tips on...

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Figure 5: Contact stiffness versus normal force for (a) a silicon probe on HOPG sample (yellow squares) (b) a...

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Figure 6: (a, b) Scanning electron microscopy images of the borosilicate glass colloid glued onto the tipless...

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Full Research Paper

Published 06 Nov 2025

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Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

Nicholas Chan,
Carrie Lin,
Tevis Jacobs,
Robert W. Carpick and
Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

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Figure 1: (a) TEM image of the apex of the AFM tip used in FM-AFM measurements. (b) Magnified TEM image of th...

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Figure 2: (a) TEM image of the AFM tip apex before AFM imaging. (b) TEM image of the AFM tip apex after AFM i...

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Figure 3: Topographic AFM image of the diamond surface showing the nanometer-scale roughness of the surface. ...

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Figure 4: (a) 20 Δf–d curves measured at one grid position on the diamond sample using a silicon AFM probe. (...

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Figure 5: (a) Example of an experimentally derived interaction force–distance curve compared to a theoretical...

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Figure 6: a) Averaged best-fit W_adh value over a 500 nm × 500 nm scan area of the diamond surface. b) Average...

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Full Research Paper

Published 06 May 2020

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Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

Zahra Abooalizadeh,
Leszek Josef Sudak and
Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

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Figure 1: TEM image of four different tips employed in the dAFM experiments. The tips are referred to as (a) ...

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Figure 2: Schematic of the non-contact/free resonance and contact resonance frequencies of the AFM cantilever...

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Figure 3: AFM (a) topographic and (b) reverse scan direction lateral force maps of the HOPG obtained by FMM. ...

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Figure 4: (a) Topographic and (b) lateral force maps acquired in the forward scan direction on uncovered and ...

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Figure 5: Line profile of (a) amplitude and (b) phase at uncovered steps acquired with the CR-mode at a conta...

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Figure 6: (a) AFM topographic map of a third area of the HOPG surface containing both uncovered and covered s...

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Figure 7: (a) Amplitude map obtained while the tip traversed four single-height, uncovered atomic steps on an...

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Figure 8: (a) Amplitude map obtained while the tip traversed two single-height uncovered atomic steps on an H...

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Figure 9: (a) Schematic of the physical construction of the cantilever. A piezo actuator (blue rectangle) exc...

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Figure 10: (a) AFM topography image, (b) amplitude, (c) corresponding converted contact stiffness and (d) corr...

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Figure 11: Force–distance curve from the static indentation measurement on an HOPG surface using a cantilever ...

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Figure 12: The elastic modulus map according to the grid pattern in four lines, where each line includes 64 ro...

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Full Research Paper

Published 03 Jul 2019

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