4 article(s) from Fantner, Georg E

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

  1. Santiago H. Andany,
  2. Gregor Hlawacek,
  3. Stefan Hummel,
  4. Charlène Brillard,
  5. Mustafa Kangül and
  6. Georg E. Fantner
  • Full Research Paper
  • Published 26 Aug 2020

  • PDF

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

  1. Nahid Hosseini,
  2. Matthias Neuenschwander,
  3. Oliver Peric,
  4. Santiago H. Andany,
  5. Jonathan D. Adams and
  6. Georg E. Fantner
  • Full Research Paper
  • Published 29 Nov 2019

  • PDF

Beilstein J. Nanotechnol. 2019, 10, 2357–2363, doi:10.3762/bjnano.10.226

High-frequency multimodal atomic force microscopy

  1. Adrian P. Nievergelt,
  2. Jonathan D. Adams,
  3. Pascal D. Odermatt and
  4. Georg E. Fantner
  • Full Research Paper
  • Published 22 Dec 2014

  • PDF

Beilstein J. Nanotechnol. 2014, 5, 2459–2467, doi:10.3762/bjnano.5.255

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

  1. Blake W. Erickson,
  2. Séverine Coquoz,
  3. Jonathan D. Adams,
  4. Daniel J. Burns and
  5. Georg E. Fantner
  • Full Research Paper
  • Published 13 Nov 2012

  • PDF

  • Supp. Info

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

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