1 article(s) from Frazzetto, Alessia

A look underneath the SiO2/4H-SiC interface after N2O thermal treatments

  • Patrick Fiorenza,
  • Filippo Giannazzo,
  • Lukas K. Swanson,
  • Alessia Frazzetto,
  • Simona Lorenti,
  • Mario S. Alessandrino and
  • Fabrizio Roccaforte

Beilstein J. Nanotechnol. 2013, 4, 249–254, doi:10.3762/bjnano.4.26

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Published 08 Apr 2013
 
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