2 article(s) from Fronk, Michael
Chemical structures of (metallo)porphyrins under review here.
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Surface topography determined by AFM as a function of thickness. Cu-TMPP (= CuTPP(OMe)4) (a) 35 nm,...
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Formation of molecular dendrites in a 117 nm thick Cu-TMPP (= CuTPP(OMe)4) sample at different regi...
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Transport in Cu-TMPP (= CuTPP(OMe)4) films and dendrites, (a–d) AFM topography characteristics. The...
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Extinction coefficient k for a) H2TMPP, b) CuTMPP and c) NiTMPP. The uniaxial anisotropic model res...
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Energy dispersion of the magneto-optical Voigt constant Q for a) H2TMPP, b) CuTMPP and c) NiTMPP. F...
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MCD (ηF) spectra in the Q-band region for a) H2TMPP, b) CuTMPP and c) NiTMPP and the modelling with...
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Results of STM measurements: (a,b) Formation of small islands at submonolayer coverage. Molecules o...
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Highly resolved filled (a) and empty molecular states (b) STM image of the square structure of H2TH...
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(a) Large scale STM image of submonolayer coverage showing molecular chains and ordered islands of H...
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(a–e) Manipulation of the electronic structure by applying a voltage pulse with the STM tip at the ...
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Left: Evolution of the XPS spectra of Br 3d for a molecular monolayer of CuTPP(Br)8 on Au(111) as a...
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Results of STM measurements: (a) Novel structure of the alternating molecular rows formed after ann...
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Beilstein J. Nanotechnol. 2017, 8, 1786–1800, doi:10.3762/bjnano.8.180
TbPc2 molecule (left). Investigated layer stack: TbPc2 thin films on cobalt grown on SiO2/Si(111).
Dielectric function of a TbPc2 film on cobalt. The blue lines and the red lines represent the real ...
Definition of the molecular tilt angle (top). Average tilt angle of the TbPc2 molecules on cobalt (...
AFM topography characteristics of TbPc2 thin films. Line scan profiles and AFM surface images for T...
AFM statistical analysis of TbPc2 thin films. (a) Average grain diameter and height as a function o...
cs-AFM electrical measurements. (a) Electrical setup employed for local electrical measurements via...
Transport mechanism for TbPc2 thin films. Red and blue solid lines indicate the average of 20 local...
Beilstein J. Nanotechnol. 2014, 5, 2070–2078, doi:10.3762/bjnano.5.215
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