1 article(s) from Gelman, Samuel

Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

  • Samuel Gelman,
  • Irit Rosenhek-Goldian,
  • Nir Kampf,
  • Marek Patočka,
  • Maricarmen Rios,
  • Marcos Penedo,
  • Georg Fantner,
  • Amir Beker,
  • Sidney R. Cohen and
  • Ido Azuri

Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83

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Published 16 Jul 2025
 
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