1 article(s) from Guillermier, Christelle
Mass spectra of a natural zircon sample before rastering with the primary beam (red) and after rast...
Jump to Figure 1
a) Backscattered electron (BSE) map of the sample, SIMS location outlined in red; b) raw and proces...
Jump to Figure 2
The calculated sputtering yield as a function of the atomic number for a 10 kV primary Ne beam impa...
Jump to Figure 3
Reflected-light micrograph of the analysed Spodumene grain. The grain has relatively unaltered regi...
Jump to Figure 4
a) Raw (solid line), b) 32 × 32 regridded (dotted line) and c) 64 × 64 regridded (dashed line) maps...
Jump to Figure 5
The relative δ7Li ratios for regions within the same grain of Spodumene as in Figure 4 and Figure 5. Four connected...
Jump to Figure 6
a) Backscatter electron image of the region of interest. The red square shows the region mapped usi...
Jump to Figure 7
Count rates relative to background count rates for 6Li (red, 3 μg/g) and 7Li (green, 37 μg/g) for t...
Jump to Figure 8
The relative δ7Li ratios for regions within the same grain of Spodumene. Values are not calibrated ...
Jump to Figure 9
a) Examples of deformed cleavage planes in a Li-rich biotite mica shown parallel to the c-axis and ...
Jump to Figure 10
Beilstein J. Nanotechnol. 2020, 11, 1504–1515, doi:10.3762/bjnano.11.133
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut