1 article(s) from Hai, Chunxi
Characterizing the degree of reduction of GO sheets reduced using various methods. C 1s XPS spectra...
Jump to Figure 1
Characterizing the degree of reduction of GO sheets using EFM imaging and EFS: (a) tapping AFM imag...
Jump to Figure 2
Illustrative diagram of EFM imaging and EFS: (a) schematic depiction of EFM, (b) electrostatic forc...
Jump to Figure 3
Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106
Subscribe to our Latest Articles RSS Feed.
Register and get informed about new articles.
Follow the Beilstein-Institut